OTHER LINKS

Journal Papers

  1. Ellis JD, Baas M, Joo K, Spronck JW. Errors in correction algorithms for periodic nonlinearity in displacement measuring interferometers, Precision Engineering 2012; 36(2): pp. 261–269
  2. Ellis JD, Voigt D, Spronck JW, Verlaan AL, Munnig Schmidt RH. Frequency Stabilized HeNe Gas Laser with 3.5 mW from a single mode, Precision Engineering 2012; 36(2): pp. 203–209
  3. Ellis JD, Meskers AJH, Spronck JW, Munnig Schmidt RH. Fiber coupled displacement interferometry without periodic nonlinearity,Optics Letters 2011; 36(18): pp. 3584–3586
  4. Voigt D, Ellis JD, Verlaan AL, Bergmans RH, Spronck JW,Munnig Schmidt RH. Towards interferometry for dimensional drift measurements with nanometer uncertainty, Measurement Science & Technology 2011; 22: 094029 (5pp)
  5. Joo K, Ellis JD, Spronck JW, Munnig Schmidt RH. Real-time wavelength corrected heterodyne laser interferometry, Precision Engineering 2010; 35(1): pp. 38–43
  6. Ellis JD, Joo K, Buice ES, Spronck JW. Frequency stabilized three mode HeNe laser using nonlinear optical phenomena, Optics Express 2010; 18(2): pp. 1373–1379
  7. Joo K, Ellis JD, Buice ES, Spronck JW, Munnig Schmidt RH. High resolution heterodyne interferometer without detectable periodic nonlinearity, Optics Express 2010; 18(2): pp. 1159–1165
  8. Joo K, Ellis JD, Spronck JW, Munnig Schmidt RH. Design of a folded, multi-pass Fabry-Perot interferometer using a He-Ne laser for displacement metrology (Technical Design Note), Measurement Science & Technology 2009; 20(10): 107001 (5pp)
  9. Ellis JD, Joo K, Spronck JW, Munnig Schmidt RH. Balanced interferometric system for stability measurements, Applied Optics 2009; 48(9): pp. 1733–1740
  10. Joo K, Ellis JD, Spronck JW, van Kan PJM, Munnig Schmidt RH. A simple heterodyne laser interferometer with sub-nm periodic errors, Optics Letters 2009; 34(3): pp. 386–388
  11. Ellis JD, Smith ST, Hocken RJ. Alignment uncertainties in ideal indentation styli, Precision Engineering 2008; 32: pp. 207–214


Conference Proceedings

  1. Gillmer SR*, Smith RGC, Woody SC, Tarbutton J, Ellis JD, Miniature, fiber-coupled 3-DOF interferometer for precision micro-motion stage metrology, In: Proceedings of the 27th ASPE Annual Meeting, 21–26 Oct 2012, San Diego, CA, USA
  2. Smith RGC, Wang C, Ellis JD, Sensitivity of optical fibers to mechanical and thermal perturbations for interferometric applications, In: Proceedings of the 27th ASPE Annual Meeting, 21–26 Oct 2012, San Diego, CA, USA
  3. Burnham-Fay ED, Ellis JD, Precision flexure stage utilizing parasitic motion, In: Proceedings of the 27th ASPE Annual Meeting, 21–26 Oct 2012, San Diego, CA, USA
  4. Katz P, Lynch T, Magill A, Maag-Tanchack, Ellis JD, UFF Belt Characterization, In: Proceedings of Optical Fabrication & Testing, 24–28 Jun 2012, Monterey, CA, USA
  5. Ellis JD*, Gillmer SR, Wang C, Smith RGC, Woody SC, Tarbutton J, Fiber-coupled 3-DOF interferometer for EUV lithography stage metrology, In: Proceedings of ASPE Summer Topical Meeting: Precision Engineering and Mechatronics Supporting the Semiconductor Industry, 24–26 Jun 2012, Berkeley, CA, USA
  6. Ellis JD, Voigt D, Spronck JW, Verlaan AL, Munnig Schmidt RH. Stabilized HeNe gas laser with greater than 3.5 mW of optical power, In: Proceedings of the 26th ASPE Annual Meeting, 13–18 Nov 2011, Denver, CO, USA
  7. Ellis JD*, Meskers AJH, Spronck JW, Munnig Schmidt RH. Towards fiber-coupled displacement measuring interferometers, In: Proceedings of the 26th ASPE Annual Meeting, 13–18 Nov 2011, Denver, CO, USA
  8. Voigt D, Ellis JD, Verlaan A, Spronck JW, Bergmans R, Munnig Schmidt RH. Displacement interferometry for dimensional stability measurements, In: Proceedings of the International Congress of Metrology, 3–6 October 2011, Paris, France
  9. Meskers AJH, Ellis JD, Spronck JW, Munnig Schmidt RH. Displacement interferometry with fiber coupled delivery, In: Proceedings of the 10th IMEKO Symposium, 12–14 Sept 2011, Braunschweig, Germany
  10. Meskers AJH, Ellis JD, Spronck JW, Munnig Schmidt RH. Fiber coupled sub nanometer displacement interferometry without periodic nonlinearity, In: Proceedings of the 10th International Symposium on Measurement Technology and Intelligent Instruments, 29 Jun – 2 July 2011, KAIST, Daejeon, Korea
  11. Voigt D, Ellis JD, Verlaan A, Spronck JW, Bergmans R, Munnig Schmidt RH. Interferometry for picometer-level dimensional stability measurements , In: Proceedings of CLEO/Europe-EQEC 2011, 21–26 May 2011, Munich, Germany
  12. Ellis JD*, BaasM, Spronck JW. Errors in measurement and compensation algorithms for periodic nonlinearity correction, In: Proceedings of the 25th ASPE Annual Meeting, 31 Oct–5 Nov 2010, Atlanta, GA
  13. Voigt D, Ellis JD, Verlaan A, Spronck JW, Bergmans R, Munnig Schmidt RH. Towards traceable metrology for material stability characterization , In: Proceedings of the NanoScale 2010, 27–29 Oct 2010, Brno, Czech Republic
  14. Verlaan A*, Ellis JD, Voigt D, Spronck JW, Munnig Schmidt RH. Interferometric system for pm-level stability characterization, In: Proceedings of the ISCO 2010, 4–8 Oct 2010, Rhodes Island, Greece
  15. Joo K, Ellis JD, Buice ES, Spronck JW, Munnig Schmidt RH. A novel heterodyne displacement interferometer with no detectable periodic nonlinearity and optical resolution doubling, In: Proceedings of the 10th euspen International Conference, 31 May – 3 Jun 2010, Delft, The Netherlands
  16. Ellis JD, Joo K, Buice ES, Spronck JW, Munnig Schmidt RH. Frequency stabilization and heterodyne system via the mixed mode in three mode HeNe lasers , In: Proceedings of the 10th euspen International Conference, 31 May - 3 Jun 2010, Delft, The Netherlands
  17. Ellis JD, Joo K, Buice ES, Spronck JW,Munnig Schmidt RH.Magnetic field effects on the secondary beat frequency profile for three mode HeNe laser stabilization, In: Proceedings of the 24th ASPE Annual Meeting, 4-9 Oct 2009, Monterey, CA
  18. Ellis JD*, Joo K, Spronck JW, Munnig Schmidt RH. Double-sided interferometer with low drift for stability testing, In: Proceedings of the 9th International Symposium on Measurement Technology and Intelligent Instruments, 29 Jun – 2 July 2009, St. Petersburg, Russia
  19. Joo K*, Ellis JD, Spronck JW, van Kan PJM, Munnig Schmidt RH. Simple heterodyne laser interferometer without periodic errors, In: Proceedings of the 9th International Symposium on Measurement Technology and Intelligent Instruments, 29 Jun – 2 July 2009, St. Petersburg, Russia
  20. Joo K, Ellis JD, Spronck JW,Munnig Schmidt RH. Wavelength corrected, non-polarizing heterodyne laser interferometry in air, In: Proceedings of the 9th euspen International Conference, 2–5 Jun 2009, San Sebastian, Spain
  21. Ellis JD*, Joo K, Verlaan A, Spronck JW, Munnig Schmidt RH. Uncertainty considerations for interferometric stability testing, In: Proceedings of the 23rd ASPE Annual Meeting, 19–23 Oct 2008, Portland, OR
  22. Buice ES, Ellis JD, Langen HH, Munnig Schmidt RH. Importance of metrology in micro-machines, In: Proceedings of the 6th InternationalWorkshop on Microfactories, 14–19 Oct 2008, Chicago, IL
  23. Ellis JD, Hatzigeorgopoulos JH, Spronck JW, Munnig Schmidt RH. Optically balanced, multi-pass displacement interferometry for picometer stability testing, In: Proceedings of the 22nd ASPE Annual Meeting, 14–19 Oct 2007, Dallas, TX
  24. Ellis JD, Smith ST, Hocken RJ. Reducing uncertainties in nanoindentation, In: Proceedings of the 7th euspen International Conference, 20–24 May 2007, Bremen, Germany; 2007 1: pp. 274-277
  25. Ellis JD, Smith ST, Hocken RJ. An instrument for nanoindentation without frame stiffness dependency, In: Proceedings of the 21st ASPE Annual Meeting, 15–20 Oct 2006, Monterey, CA
* denotes oral speaker
© Jonathan D. Ellis, October 2012. Designed and created by Surjya Ray
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