Jonathan D. Ellis
Assistant Professor, Department of Mechanical Engineering
Assistant Professor, The Institute of Optics
PhD, Delft University of Technology, Netherlands, 2010
215 Hopeman Building
Fax: (585) 256-2509
My overall research theme is building novel instruments which enhance metrology capabilities and are used to improve manufacturing processes. I am also interested in system integration for metrology tools onto existing precision systems or designing scratch-built systems for custom applications. My current research projects are in designing and developing smart optical sensors for compact, remote displacement sensing and for multi-DOF interferometry. In addition to those, I am interested in linear displacement interferometry, high power gas laser frequency stabilization, refractometry, flexure systems, stage metrology, precision machine design, and capacitance sensor design.